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MIL-PRF-19500-598 Semiconductor Device, Transistors, Quad, Field Effect, P-Channel And N-Channel, Silicon, Type 2N7336, Jan, Jantx, Jantxv, And JansThis specification covers the performance requirements for quad N-channel and P-channel, enhancement- mode, MOSFET, power transistor, with avalanche energy ratings \(EAS and EAR\) and maximum avalanche current \(IAR\). Four levels of product assurance are provided for each device type as specified in MIL?√PRF?√19500.

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MIL�PRF�19500/598C
4.3 Screening (quality levels JANS, JANTX and JANTXV only). Screening shall be in accordance with table E�IV
of MIL�PRF�19500, and as specified herein. The following measurements shall be made in accordance with table I
herein. Devices that exceed the limits of table I herein shall not be acceptable.
Screen
Measurement (1) (2)
(see table E�IV of
JANS level
JANTX and JANTXV levels
(3)
Gate stress test (see 4.3.1)
Gate stress test (see 4.3.1)
Method 3470 of MIL�STD�750, (see
Method 3470 of MIL�STD�750, (see 4.3.2)
(3) (4)
4.3.2) optional
optional
Method 3161 of MIL�STD�750, (see 4.3.3)
3c (3)
Method 3161 of MIL�STD�750, (see
IGSSF1, IGSSR1, IDSS1, see table I subgroup 2
See table I, subgroup 2 herein
9
herein
Method 1042 of MIL�STD�750, test
Method 1042 of MIL�STD�750, test
10
condition B
condition B
IGSSF1, IGSSR1, IDSS1, rDS(on)1, VGS(th)1
IGSSF1, IGSSR1, IDSS1, rDS(on)1,
11
VGS(th)1, subgroup 2 of table I herein
Subgroup 2 of table I herein;
ĆIGSSF1 = �20 nA dc or �100 percent of
initial value, whichever is greater.
ĆIGSSR1 = �20 nA dc or �100 percent of
initial value, whichever is greater.
ĆIDSS1 = �25 �A dc or �100 percent of
initial value, whichever is greater.
Method 1042 of MIL�STD�750,
Method 1042 of MIL�STD�750, test condition A
12
test condition A, t = 240 hours.
Subgroup 2 of table I herein;
Subgroups 2 and 3 of table I herein;
ĆIGSSF1 = �20 nA dc or �100 percent of
ĆIGSSF1 = �20 nA dc or �100 percent of
13
initial value, whichever is greater.
initial value, whichever is greater.
ĆIGSSR1 = �20 nA dc or �100 percent of
ĆIGSSR1 = �20 nA dc or �100 percent of
initial value, whichever is greater.
initial value, whichever is greater.
ĆIDSS1 = �25 �A dc or �100 percent of
ĆIDSS1 = �25 �A dc or �100 percent of
initial value, whichever is greater.
initial value, whichever is greater.
ĆrDS(on)1 = �20 percent of initial value
ĆrDS(on)1 = �20 percent of initial value
ĆVGS(th)1 = �20 percent of initial value.
ĆVGS(th)1 = �20 percent of initial value.
(1)
At the end of the test program, IGSSF1, IGSSR1, and IDSS1 are measured.
An out-of-family program to characterize IGSSF1, IGSSR1, IDSS, and VGS(th)1 shall be invoked.
(2)
(3)
Shall be performed anytime before screen 9.
(4)
This test method in no way implies a repetitive single pulse avalanche energy rating. This test need not be
performed in group A when performed as a screen.
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