MIL-PRF-19500/613E
*
4.3 Screening (JANS, JANTX, and JANTXV levels only). Screening shall be in accordance with MIL-PRF-19500,
table E-IV, and as specified herein. The following measurements shall be made in accordance with table I herein.
Devices that exceed the limits of table I herein shall not be acceptable.
Measurements
Screen (see table E-IV
of MIL-PRF-19500)
JANS level
JANTX and JANTXV levels
(1) 3c
Thermal impedance (see 4.3.2)
Thermal impedance (see 4.3.2)
9
Not applicable
ICES1 and hFE2
Subgroup 2 of table I herein;
ICES1 and hFE2
11
ICES1 and hFE2; ĆICES1 = 100 percent of
initial value or 100 nA dc, whichever is
greater.
ĆhFE2 = ± 20 percent of initial value.
12
t = 240 hours
t = 160 hours minimum
Subgroup 2 of table I herein;
Subgroups 2 and 3 of table I herein;
13
ICES1 and hFE2;
ICES1 and hFE2;
ĆICES1 = 100 percent of initial value or
ĆICES1 = 100 percent of initial value or 100
100 nA dc, whichever is greater.
nA dc, whichever is greater.
ĆhFE2 = ±20 percent of initial value.
ĆhFE2 = ±20 percent of initial value.
For TO-254AA packages: Method 1081 of
For TO-254AA packages: Method 1081
17
MIL-STD-750 (see 4.3.3), Endpoints:
of MIL-STD-750 (see 4.3.3), Endpoints:
*
Subgroup 2 of table I herein.
Subgroup 2 of table I herein.
*
(1) Shall be performed anytime after temperature cycling, screen 3a; JANTX and JANTXV levels do not need to
be repeated in screening requirements.
4.3.1 Power burn-in conditions. Power burn-in conditions are as follows: TJ = 187.5 ±12.5°C, VCE ≥ 20 V dc, TA ≤
100°C.
4.3.2 Thermal impedance. The thermal impedance measurements shall be performed in accordance with method
3131 of MIL-STD-750 using the guidelines in that method for determining IM, IH, tH, tSW, (and VH where appropriate).
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