MIL-PRF-19500/613E
TABLE I. Group A inspection.
MIL-STD-750
Limits
Symbol
Unit
Inspection 1/
Min
Max
Method
Conditions
Subgroup 1
Visual and mechanical
2071
examination
Subgroup 2
°C/W
Thermal impedance 2/
3131
See 4.3.2
ZθJX
Collector to emitter
3011
Bias condition D; IC = 100 mA dc,
V(BR)CEO
80
V dc
breakdown voltage
IB = 0, pulsed (see. 4.5.1)
µA dc
Collector to emitter
3041
Bias condition C;
ICES1
1.0
VCE = 60 V dc; V
cutoff current
BE = 0
Collector to emitter
3041
Bias condition C;
ICES2
1.0
mA dc
VCE = 100 V dc; V
cutoff current
BE = 0
µA dc
Collector to emitter
3041
Bias condition D;
ICEO
50
VCE = 40 V dc; I
cutoff current
B=0
µA dc
Emitter to base
3061
Bias condition D;
IEBO1
1.0
VEB = 4 dc; I
cutoff current
C=0
Emitter to base
3061
Bias condition D;
IEBO2
1.0
mA dc
VEB = 5.5 dc; I
cutoff current
C=0
Forward-current
3076
VCE = 5.0 V dc; IC = 50 mA dc;
hFE1
50
transfer ratio
pulsed (see 4.5.1)
Forward-current
3076
VCE = 5.0 V dc; IC = 2.5 A dc;
hFE2
70
200
transfer ratio
pulsed (see 4.5.1)
Forward-current
3076
VCE = 5.0 V dc; IC = 5.0 A dc;
hFE3
40
transfer ratio
pulsed (see 4.5.1)
Base to emitter
3066
Test condition B; VCE = 5.0 V dc, IC
VBE
1.45
V dc
non-saturated voltage
= 2.5 A dc, pulsed (see 4.5.1)
Base to emitter
3066
Test condition A; IC = 2.5 A dc
VBE(SAT)1
1.45
V dc
saturated voltage
IB = 250 mA dc, pulsed (see 4.5.1)
Base to emitter
3066
Test condition A; IC = 5.0 A dc
VBE(SAT)2
2.2
V dc
saturated voltage
IB = 500 mA dc, pulsed (see 4.5.1)
Collector to emitter
3071
IC = 2.5 A dc; IB = 250 mA dc;
VCE(sat)1
0.75
V dc
saturated voltage
pulsed (see 4.5.1)
Collector to emitter
1.5
V dc
VCE(sat)2
IC = 5.0 A dc; IB = 500 mA dc;
saturated voltage
3071
pulsed (see 4.5.1)
See footnotes at end of table.
8
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