For Parts Inquiries call (727) 344-9615
A Service Disabled Veteran Owned Small Business
© Copyright 2015 Integrated Publishing, Inc.

MIL-PRF-19500-613 Semiconductor Device, Transistor, Npn, Silicon, Power, Type 2N7373, Jan, Jantx, Jantxv, Jans And Jansm, D, P, L, R, F, G, And HThis specification covers the performance requirements for NPN, silicon, power transistors for use in high-speed power switching applications. Four levels of product assurance are provided as specified in MIL-PRF-19500. Provisions for radiation hardness assurance \(RHA\) to eight radiation levels is provided for JANS product assurance level. RHA level designators M, D, P, L, R, F, G, and H are appended to the device prefix to identify devices, which have passed RHA requirements.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14


. . . . . .
MIL-PRF-19500/613E
4.4.4 Group D inspection. Conformance inspection for hardness assured JANS types shall include the group D
tests specified in table II herein. These tests shall be performed as required in accordance with MIL-PRF-19500 and
method 1019 of MIL-STD-750, for total ionizing dose or method 1017 of MIL-STD-750 for neutron fluence as
applicable (see 6.2 herein), except group D, subgroup 2 may be performed separate from other subgroups. Group D
inspection may also be performed ahead of the screening lot using die selected in accordance with MIL-PRF-19500
and related documents. Alternate package options may also be substituted for the testing provided there is no
adverse effect to the fluence profile.
4.4.5 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-IX of MIL-PRF-19500 and table III herein. Electrical measurements (end-points) shall be
in accordance with table I, subgroup 2 herein.
4.5 Method of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows:
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750.
4.5.2 Inspection conditions. Unless otherwise specified in MIL-PRF-19500 or herein, all inspections shall be
conducted at a case temperature (TC) of +25°C ±3°C.
4.5.3 Group B accelerated life test. This test shall be conducted using one of the two options listed herein (4.5.3.a
and 4.5.3.b) with the following conditions applying to all options: VCB = 20 V minimum dc; 96 hours minimum; TJ =
+275°C.
PT = 2.5; PT adjusted to give a lot average of TJ = +275°C with TA = +125°C ± 25°C.
a.
TA = +25°C ±3°C with PT adjusted to give a lot average of TJ = +275°C.
b.
7



For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business

© Copyright 2015 Integrated Publishing, Inc. Site Design & Marketing by Strategico.