MIL-PRF-19500/276H
* TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Limit
Unit
Symbol
Method
Conditions
Min
Max
Subgroup 4 - Continued.
2N2323A, AS, AU4
R3 = 2 k ohm
2N2324A, AS, AU4
2N2326A, AS, AU4
2N2328A, AS, AU4
2N2329A, AS, AU4
2N2323, U4, S, A, AU4, AS
VR = 50 V dc
2N2324, U4, S, A, AU4, AS
VR = 100 V dc
2N2326, U4, S, A, AU4, AS
VR = 200 V dc
2N2328, U4, S, A, AU4, AS
VR = 300 V dc
2N2329, U4, S, A, AU4, AS
VR = 400 V dc
Subgroup 5
Not applicable
Subgroup 6
See figure 8; TA = 122°C,
Surge current
4066
IFM = 15 A; 10 surges, 1 per
minute, IO = 0 at rated VRWM,
f = 60 Hz
Electrical end-point
See table II, steps 1, 2, 3, and 4
measurements
Subgroup 7
Nonrepetitive peak voltage
See figure 9, 10 pulses.
2N2323, U4, S, A, AU4, AS
VRM = 75 V dc
2N2324, U4, S, A, AU4, AS
VRM = 150 V dc
2N2326, U4, S, A, AU4, AS
VRM = 300 V dc
2N2328, U4, S, A, AU4, AS
VRM = 400 V dc
2N2329, U4, S, A, AU4, AS
VRM = 500 V dc
Electrical end-point
See table II, steps 1, 2, 3, and 4
measurements
1/ For sampling plan see MIL-PRF-19500.
2/ For resubmission of failed table I, subgroup 1, double the sample size of the failed test or sequence of tests. A
failure in table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun upon
submission.
3/ Separate samples may be used.
4/ Not required for laser marked devices.
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