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MIL-PRF-19500-276 Semiconductor Device, Thyristors \(Controlled Rectifiers\), Silicon, Types 2N2323, 2N2324, 2N2326, 2N2328, 2N2329, And S And U4 Versions, 2N2323A, 2N2324A, 2N2326A, 2N2328A, 2N2329A, And As And Au4 Versions, Jan, Jantx, And JantxvThis specification covers the performance requirements for PNPN, silicon, reverse-blocking-triode thyristors. Three levels of product assurance are provided for each device type as specified in MIL-PRF-19500.

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MIL-PRF-19500/276H
4. VERIFICATION
4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:
a. Qualification inspection (see 4.2).
b. Screening (see 4.3).
c. Conformance inspection (see 4.4).
4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as specified
herein.
* 4.3 Screening (JANTX and JANTXV levels). Screening shall be in accordance with appendix E, table IV of
MIL-PRF-19500, and as specified herein. The following measurements shall be made in accordance with table I
herein. Devices that exceed the limits of table I herein shall not be acceptable.
Measurement
Screen (see
table IV of
JANTX and JANTXV levels
MIL-PRF-19500)
2
Optional
3a
Required
3b
Not applicable
4
Optional
5
Not applicable
7a and 7b
Optional
8
Not required
9
Not applicable
10
Not applicable
11
IRBX1, IFBX1, VGT1, IGT1
12
See 4.3.1
(1) 13
Subgroup 2 of table I herein:
ĆIRBX1 = ± 4.0 µA dc;
ĆIFBX1 = +4.0 µA dc.
14a and 14b
Required
15
Not required
16
Not required
(1) Devices which exceed the table I limits for this test shall be rejected.
6



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