MIL-PRF-19500-323 Semiconductor Device, Transistor, Pnp, Silicon, Switching, Types 2N3250A, 2N3251A, 2N3250Aub, 2N3251Aub, Jan, Jantx, Jantxv, Jantxvm, Jantxvd, Jantxvp, Jantxvl, Jantxvr, Jantxvf, Jantxvg, Jantxvh, Jans, Jansm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg, Jansh, Janhc, Janhcm, Janhcd, Janhcp, Janhcl, Janhcr, Janhcf, Janhcg, Janhch, Jankc, Jankcm, Jankcd, Jankcp, Jankcl, Jan...This specification covers the performance requirements for PNP silicon switching transistors. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Two levels of product assurance are provided for die. RHA level designators "M", "D", "P", "L", "R", "F", "G", and "H" are appended to the device prefix to identify devices which have passed RHA requirements.

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MIL-PRF-19500/323N

TABLE IV. Group B and C delta measurements. 1/ 2/ 3/

Step

Inspection

MIL-STD-750

Symbol

Limits

Unit

Method

Conditions

Min

Max

�25 percent change from

ĆhFE3

Forward-current

3076

VCE = 1.0 V dc;

transfer ratio

initial value.

IC = 10 mA dc;

pulsed (see 4.5.1)

ĆICBO2

Collector - base

3036

Bias condition D;

100 percent of initial value

cutoff current

or 5 nA dc, whichever is

VCB = 40 V dc

greater.

ĆVCE(Sat)2

Collector - emitter

3071

50 mV dc change from

IC = 50 mA dc;

voltage (saturated)

initial value.

IB = 5.0 mA dc

The delta measurements for table E-VIa (JANS) of MIL-PRF-19500 are as follows:

a. Subgroup 4, see table IV herein, step 3.

b. Subgroup 5, see table IV herein, steps 1, 2, and 3.

The delta measurements for 4.4.2.2 (JAN, JANTX, and JANTXV) are as follows: Following all steps in 4.4.2.2

herein, steps 1, 2, and 3 of table IV herein.

The delta measurements for table E-VII of MIL-PRF-19500 are as follows: Subgroup 6, see table IV herein,

steps 1 and 2 (for JANS).