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MIL-PRF-19500-411 Semiconductor Device, Diode, Silicon, Power Rectifier, Fast Recovery, 1N5415 Through 1N5420, 1N5415Us Through 1N5420Us, Jan, Jantx, Jantxv, Jans, Jantxvm, Jantxvd, Jantxvr, Jantxvh, Jansm, Jansd, Jansr, And JanshThis specification covers the performance requirements for silicon rectifier diodes. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500. Provision for radiation hardness assurance \(RHA\) to four radiation test levels is provided for JANTXV and JANS product assurance levels. RHA level designators "M", "D", "R", and "H" are appended to the device prefix to identify devices which have passed RHA requirements.

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MIL-PRF-19500/411R
TABLE III. Group E inspection (all quality levels) for qualification and requalification only - Continued.
Inspection
Sampling plan
Method
Conditions
Subgroup 8 3/
Peak reverse power (PRM) shall be characterized by
Peak reverse power
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the supplier and this data shall be available to the
45 devices
Government. Test shall be performed on each sublot.
Electrical measurements
During the PRM test, the voltage (VBR) shall be
monitored to verify it has not collapsed. Any collapse
in VBR during or after the PRM test, or rise in leakage
current (IR) after the test that exceeds IR1 in group A,
shall be considered a failure to that level of applied
PRM. Progressively higher levels of PRM shall be
applied until failure occurs on all devices within the
chosen sample size.
Subgroup 9
45 devices
Resistance to glass
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Step stress to destruction by increasing cycles or up to
cracking
a maximum of 25 cycles.
Subgroup 10
22 devices
c=0
Condition A, IFSM = 80 A(pk); ten surges of 8.3 ms
Forward surge
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each at 1 minute intervals, superimposed on IO = 2 A
dc; VRWM = rated VRWM (see col. 3 of 1.3). TA =
+55°C.
Electrical measurement
See table I, subgroup 2, and table IV, herein.
1/ Test method 1056 condition D, using liquid nitrogen may be used in lieu of TM 1051.
2/ Opaque glass double plug non cavity axial lead diodes may use TM 2068 in lieu of TM 1071.
3/ The sample size for this step stress requirement shall be determined by the supplier. A statistically significant
sample size is required.
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