MIL-PRF-19500/429N
4.5 Methods of inspection. Methods of inspection shall be specified in the appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750.
4.5.2 Inspection conditions. Unless otherwise specified, all inspections shall be conducted at an ambient
temperature TA of +25°C ±3°C.
4.5.3 Burn-in and life tests. These tests shall be conducted with a half-sine waveform of the specified peak voltage
impressed across the diode in the reverse direction followed by a half-sine waveform of the specified average
rectified current. The forward conduction angle of the rectified current shall be neither greater than 180 degrees, nor
less than 150 degrees.
4.5.3.1 Free air burn-in and life tests. The use of a current limiting or ballast resistor is permitted provided that
each DUT still sees the full Pt (minimum) and that the minimum applied voltage, where applicable, is maintained
through out the burn-in period. Suppliers must report the (heat sinking), thermal resistance of their mounting
conditions in all life test and burn-in boards to the qualifying activity.
4.5.4 Scope display evaluation. Scope display evaluation shall be stable in accordance with method 4023 of
MIL-STD-750. Scope display may be performed on ATE (automatic test equipment) for screening only with the
approval of the qualifying activity. Scope display in table I, subgroup 4 shall be performed on a scope. Reverse
current (IBR) over the knee shall be 500 µA peak.
11
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business