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MIL-PRF-19500-503 Semiconductor Device, Diode, Silicon, Power Rectifier, Ultra Fast Recovery, Types 1N6073 Through 1N6081, Jan, Jantx, Jantxv, And JanhcThis specification covers the performance requirements for three separate series of silicon, ultra fast recovery semiconductor diodes for use as power rectifiers. Three levels of product assurance are provided for each device type as specified in MIL-PRF-19500. One level of product assurance are provided for each unencapsulated device type.

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MIL-PRF-19500/503H
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as
specified herein.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500 and table I
herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-VIB (JAN, JANTX, and JANTXV) of MIL-PRF-19500. Electrical
measurements (end-points) and delta requirements shall be in accordance with the applicable steps of table III
herein.
Subgroup
Method
Condition
Thermal shock, 0°C to +100°C, 10 cycles.
B2
1056
Temperature cycling, -55°C to +175°C, 25 cycles.
B2
1051
*
B2
4066
Condition A, IFSM = rated IFSM (see 1.3); ten surges of 8.3 ms each at 1 minute
intervals, super-imposed on IO1 (see 1.3); VRWM = rated VRWM (see 1.3).
B3
1027
IO1(min) = rated IO1 (see col. 4 of 1.3); adjust IO to achieve the required TJ apply
VR = rated VRWM (see 1.3), f = 50-60 Hz (see 4.3.1.1). Mounting conditions (see
4.5.5.1). TJ = 150° minimum.
+25°C ≤ TA ≤ +35°C (recorded before test is performed); RθJL (maximum) (see
B5
4081
col. 8 of 1.3); L = 0 inch (0 mm).
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in appendix E, table E-VII of MIL-PRF-19500. Electrical measurements (end-points) and delta
requirements shall be in accordance with the applicable steps of table III herein.
4.4.3.1 Group C inspection, appendix E, table E-VII of MIL-PRF-19500.
Subgroup
Method
Condition
Thermal shock, 0°C to +100°C, 15 cycles.
C2
1056
Temperature cycling, -55°C to +175°C, 25 cycles.
C2
1051
C2
2036
Tension test condition A, t = 15s, for 1N6073 through 1N6075, weight = 12
lbs., for 1N6076 through 1N6081, weight = 20 lbs.
+25°C ≤ TA ≤ +35°C (recorded before test is performed); RθJL (maximum)
C5
4081
(see col. 8 of 1.3); L = 0 inch (0 mm).
C6
1027
IO1(min) = rated IO1 (see col. 4 of 1.3); adjust IO to achieve the required TJ
apply VR = rated VRWM (see 1.3), f = 50-60 Hz (see 4.3.1.1). Mounting
conditions (see 4.5.5.1). TJ = 150° minimum.
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