For Parts Inquiries call (727) 344-9615
A Service Disabled Veteran Owned Small Business
© Copyright 2015 Integrated Publishing, Inc.

MIL-PRF-19500-596 Semiconductor Device, Repetitive Avalanche, Field Effect, Transistor, N-Channel, Silicon, Types 2N7218, 2N7219, 2N7221, 2N7222, 2N7218U, 2N7219U, 2N7221U, And 2N7222U, Jan, Jantx, Jantxv, Jans, Janhc, And JankcThis specification covers the performance requirements for a N-channel, enhancement mode, MOSFET, power transistor intended for use in high density power switching applications. Four levels of product assurance are provided for each device type as specified in MIL-PRF-19500, with avalanche energy maximum ratings \(EAR and EAS\) and maximum avalanche current IAR. Two levels of product assurance are provided for die \(element evaluation\).

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14


MIL-PRF-19500/596K
*
4.4.2.1 Group B inspection, table E-VIA (JANS) of MIL-PRF-19500.
Subgroup
Method
Conditions
B3
1051
Test condition G.
*
B4
1042
Test condition D; the heating cycle shall be 1 minute minimum. No
heat sink or forced air cooling on the device shall be permitted during the cycle.
B5
1042
A separate sample may be pulled for each test. Accelerated steady-state reverse
bias, test condition A, VDS = rated, TA = +175°C, t = 120 hours, read and record
V(BR)DSS (pre and post at 1 mA = ID. Read and record IDSS (pre and post). Deltas for
V(BR)DSS shall not exceed 10 percent and IDSS shall not exceed 25 µA.
Accelerated steady-state gate bias, condition B, VGS = rated, TA = +175°C,
t = 24 hours.
B5
2037
Bond strength; test condition D.
4.4.2.2 Group B inspection, table E-VIB (JAN, JANTX, and JANTXV) of MIL-PRF-19500.
Subgroup
Method
Condition
B2
1051
Test condition G.
B3
1042
Test condition D, 2,000 cycles minimum. The heating cycle shall be 1 minute
minimum.
*
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500 and as follows. Electrical measurements (end-points) shall be in
accordance with the inspections of table I, subgroup 2 herein.
Subgroup
Method
Condition
C2
2036
Tension: Test condition A; weight = 10 lbs, t = 10 s (not applicable to "U" suffix
version).
See 4.3.4, RθJC(max) shall be 1.0°C/W.
C5
3161
*
C6
1042
Test condition D. The heating cycle shall be 1 minute minimum.
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-IX of MIL-PRF-19500 and as specified herein. Electrical measurements (end-points) shall
be in accordance with table I, subgroup 2.
4.5 Methods of inspection. Methods of inspection shall be as specified in appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurements shall be as specified in MIL-STD-750.
10



For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business

© Copyright 2015 Integrated Publishing, Inc. Site Design & Marketing by Strategico.