For Parts Inquiries call (727) 344-9615
A Service Disabled Veteran Owned Small Business
© Copyright 2015 Integrated Publishing, Inc.

MIL-PRF-19500-605 Semiconductor Device, Field Effect Radiation Hardened \(Total Dose Only\) Transistors, N-Channel, Silicon, Types 2N7292, 2N7294, 2N7296, And 2N7298, Jantxvm, D, R, H And Jansm, D And RThis specification covers the performance requirements for an N-Channel, enhancement-mode, MOSFET, radiation hardened \(total dose only\), power transistor intended for use in high density power switching applications. Two levels of product assurance are provided for each device type specified in MIL-PRF-19500.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14


MIL-PRF-19500/605D
4.4.2.1 Group B inspection, table E-VIA (JANS) of MIL-PRF-19500.
Subgroup Method Condition
B3
1051 Condition G, 100 cycles.
B4
1042 Condition D. No heat sink or forced air cooling on the device shall be permitted
during the on cycle. ton = 30 seconds minimum.
1042 Condition A; VDS = 100 percent of rated; TA = +175°C, t = 120 hours, or TA = +150°C,
B5
t = 120 hours minimum. Read and record VBR(DSS) (pre and post) at ID = 1 mA; Read and
record IDSS (pre and post) in accordance with table I, subgroup 2.
1042 Condition B; VGS = 100 percent of rated; TA = +175°C; t = 24 hours minimum.
B5
4.4.2.2 Group B inspection, table E-VIB (JANTXV) of MIL-PRF-19500.
Subgroup Method
Condition
B2
1051 Test condition G, 25 cycles.
B3
1042 The heating cycle shall be 30 seconds minute minimum.
B5
Not applicable.
B6
Not applicable.
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500, and as follows. Electrical measurements (end-points) shall be in
accordance with table I, subgroup 2 herein.
Subgroup Method
Condition
C2
2036
Terminal strength, test condition A, weight = 10 lbs., t = 15 sec.
See 4.5.2, RθJC(max) = 1.00°C/W.
C5
3161
C6
1042
Test condition D; 1 cycle = 30 sec. min.
4.4.4 Group D Inspection. Group D inspection shall be conducted in accordance with table E-VIII of
MIL-PRF-19500 and table II herein.
4.4.5 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-IX of MIL-PRF-19500 and as specified herein. Electrical measurements (end-points) shall
be in accordance with table I, subgroup 2 herein.
4.5 Methods of inspection. Methods of inspection shall be as specified in appropriate tables and as follows.
4.5.1 Pulse measurements. Conditions for pulse measurement shall be as specified in section 4 of MIL-STD-750.
4.5.2 Thermal resistance. The thermal resistance measurements shall be performed in accordance with method
3161 of MIL-STD-750 using the guidelines in that method for determining IM, IH, tH, tSW (and VH where appropriate).
Measurement delay time (tMD) = 70 µs max. See table E-IX of MIL-PRF-19500, group E, Subgroup 4.
8



For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business

© Copyright 2015 Integrated Publishing, Inc. Site Design & Marketing by Strategico.