MIL-PRF-19500-182 Semiconductor Device, Transistor, Npn, Silicon, Low-Power Types 2N720A, 2N720Aub, 2N1893, 2N1893S, Jans, Jan, Jantx, Jantxv, Janhc2N720A And Jankc2N720A, Jansm, Jansd, Jansp, Jansl, Jansr, Jansf, Jansg,Jansh, Janhcm, Janhcd, Janhcl, Janhcr, Jancf, Janhcg, Janhch, Jankcm, Jankcd, Jankcp, Jankcl, Jankcr, Jankcf, Jankcg, And JankchThis specification covers the performance requirements for NPN silicon, low-power transistors. Three levels of product assurance are provided for each device type as specified in MIL-PRF-19500, two levels of product assurance are provided for die.Radiation hardness assurance \(RHA\) level designators ┬ôM┬ö, ┬ôD┬ö, ┬ôP┬ô, ┬ôL┬ö ┬ôR┬ö, ┬ôF┬Æ, ┬ôG┬ö, and ┬ôH┬ö are appended to the device prefix to identify devices which have passed RHA requirements.

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14 - 15 - 16

MIL-PRF-19500/182H

* TABLE I. Group A inspection - Continued.

Inspection 1/

MIL-STD-750

Limit

Unit

Symbol

Method

Conditions

Min

Max

Subgroup 4 - Continued

Small signal short circuit

3216

0.5

� ohms

VCB = 10 V dc, IC = 5 mA dc

hob

output admittance

-4

Small signal open circuit

3211

1.5 x 10

VCB = 10 V dc, IC = 5 mA dc

hrb

reverse voltage transfer

ratio

Open circuit output

3236

VCB = 10 V dc, IE = 0,

Cobo

capacitance

100 kHz ≤ f ≤ 1 MHz

Pulse response

3251

Test condition A, except test circuit

ton + toff

and pulse requirements.

See figure 9 herein.

Subgroups 5, 6, and 7

Not appicable

1/ For sampling plan see MIL-PRF-19500.

2/ For resubmission of failed test in subgroup 1 of table I, double the sample size of the failed test or sequence of tests.

A failure in table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun upon

submission.

3/ Not required for laser marked devices.

4/ This hermetic seal test is an end-point to temp-cycling in addition to electrical measurements.