MIL-PRF-19500/444N
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VII of MIL-PRF-19500, and as follows. Electrical measurements (end-points) shall be in
accordance with table I, subgroup 2 herein.
Subgroup
Method
Condition
*
C2
See 4.5.4
Preconditioning for temperature cycling.
0°C to +100°C, 15 cycles, n = 22, c = 0.
C2
1056
-55°C to +150°C, 20 cycles, n = 22, c = 0.
C2
1051
C2
2036
(Not applicable to surface mount devices); lead fatigue conditions: Test condition E;
.062 inch (1.57 mm) lead restriction from case. Tension conditions: Test condition A;
10 pounds, 15 seconds.
RθJEC = 100°C/W (maximum) +25°C ≤ TR ≤ +35°C, at TH ≥ 25 seconds in still air.
C5
4081
(See 4.3.3.)
RθJL = 250°C/W (maximum) at .375 inch (9.52 mm) lead length,
C5
4081
+25°C ≤ TR ≤ +35°C, at TH ≥ 25 seconds in still air. (See 4.3.3.)
C6
1038
HTRB in accordance with 4.3.1.
4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the tests and conditions
specified for subgroup testing in table E-IX of MIL-PRF-19500, and table II herein. Electrical measurements (end-
points) shall be as specified in table II.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Steady-state operation life. This test shall be conducted with a half-sine wave of the specified peak voltage
impressed across the diode in the reverse direction followed by a half-sine waveform of the specified average
rectified current. The forward conduction angle of the rectified current shall not be greater than 180 degrees nor less
than 150 degrees.
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